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In 2010 Rohde & Schwarz entered the oscilloscope market. 2005 the company acquired HAMEG, a manufacturer of low-end oscilloscopes. Read more...
Latest Oscilloscope News |
Verification of MIPI D-PHY Interfaces
20 November 2014 - MIPI D-PHY is becoming an established data interface for cameras and screens in smartphones and tablets. Its high data rate of 1.5 Gbit/s is increasing the importance of signal integrity in assembly design and component selection. Rohde & Schwarz has expanded the functional range of its R&S RTO high performance oscilloscopes to include automated MIPI D-PHY compliance tests to ensure seamless interaction between components made by different manufacturers.
USB Oscilloscope Drivers for BeagleBone Black and Raspberry Pi
19 November 2014 - Pico Technology has just released beta drivers for its oscilloscope and data logging devices to run on the ARM-based BeagleBone Black and Raspberry Pi development boards. The new drivers give programmers access to a wide range of compact, economical USB oscilloscopes and data loggers. These include high-speed oscilloscopes with bandwidths up to 500 MHz, high-resolution 12-bit and 16-bit oscilloscopes, and deep-memory oscilloscopes with buffer sizes up to 512 MS.
Passive Oscilloscope Probes operate over wide Temperature Range
18 November 2014 - The 10:1 passive oscilloscope probes Model 702902 and 702906 from Yokogawa operate over a wide temperature range from -40°̊C to +85̊C. They are ideally suited to use in accelerated testing and validation methods where temperature cycling is part of the test procedure. The 702902 is designed for use with the isolated BNC input modules of Yokogawa's DL850E ScopeCorder family, whereas the 702906 is intended to be used with the non-isolated BNC inputs of the Yokogawa DLM4000 and DLM2000 Series of oscilloscopes.
Tektronix releases Test Solution for MIPI M-PHY Specification v3.1
17 November 2014 - Tektronix announced the first physical layer transmitter characterization and debug solution for the MIPI M-PHY v3.1 specification recently approved by the MIPI Alliance. The new Tektronix solution includes support for MIPI M-PHY High Speed Gears 1, 2 and 3, PWM Mode (G0-G7), and SYS Mode and offers the industry’s lowest noise solution for MIPI M-PHY measurements when used with Tektronix MSO/DPO 70000DX oscilloscopes and P7600 series probes.
CAN FD and SENT Triggering and Decode Options
13 November 2014 – Keysight Technologies introduced CAN FD (controller area network with flexible data-rate) and SENT (single-edge nibble transmission) decoding and triggering options for its InfiniiVision 4000 X-Series oscilloscopes. The new capabilities improve engineers’ efficiency in debugging CAN FD and SENT serial buses, which are used primarily in automotive applications.
Oscilloscope Probes for High-Voltage Signal Measurements
12 November 2014 – Keysight Technologies introduced 200-, 300- and 500-MHz, high-voltage probing solutions with a wider input range, higher common-mode rejection ratio and optimized accessories. The probes are ideal for testing today’s switching power supplies or power devices and for measuring motor drives and vehicle buses. The Keysight N2804A differential probe offers up to 300-MHz bandwidth and ±300-Vdc + peak AC of the maximum differential input range, allowing engineers to use it for a broad range of power applications.
Teledyne LeCroy presents 100 GHz Oscilloscope
11 November 2014 - Teledyne LeCroy introduces the LabMaster 10-100Zi featuring a real-time bandwidth of 100 GHz and a sample rate of 240 GS/s. The 100 GHz technology was first publicly demonstrated in July 2013, and has since been featured at the 2014 DesignCon, OFC and ECOC exhibitions. The technology included in the LabMaster 10-100Zi is key to analyzing and understanding the fastest phenomena found in R&D of next-generation communication systems, high bandwidth electrical components, and fundamental scientific research.
Oscilloscope Basics |
Oscilloscope Probes – Vital Link in the Measurement Chain
Signal measurement results can only be as accurate as the test and measurement tools in use. As clock rates and edge speeds of today’s electronic circuits increase, probing becomes a critical piece of the measurement system – the component that comes in direct contact with your circuit. This article looks at voltage probing considerations for embedded system and digital design debugging applications.
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Oscilloscope Background |
Precision Phase Noise Measurement with an Oscilloscope - Part 1
Often clock jitter induced from the power supply noise, signal routings, or other signals severely degrade the performance of the system. Clock generation and distribution in a FPGA for a high speed analog application is particularly prone to these issues. They manifest themselves in phase noise or clock jitter, which is the random variation of the period of a signal over time. Clearly, optimization of the design requires verification of the integrity of such clocks.
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